{{Short description|none}} This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.
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== Symbols == * μSR – see muon spin spectroscopy * χ – see magnetic susceptibility
== A == * AAS – Atomic absorption spectroscopy * AED – Auger electron diffraction * AES – Auger electron spectroscopy * AFM – Atomic force microscopy * AFS – Atomic fluorescence spectroscopy * Analytical ultracentrifugation * APFIM – Atom probe field ion microscopy * APS – Appearance potential spectroscopy * ARPES – Angle resolved photoemission spectroscopy * ARUPS – Angle resolved ultraviolet photoemission spectroscopy * ATR – Attenuated total reflectance
== B == * BET – BET surface area measurement (BET from Brunauer, Emmett, Teller) * BiFC – Bimolecular fluorescence complementation * BKD – Backscatter Kikuchi diffraction, see EBSD * BRET – Bioluminescence resonance energy transfer * BSED – Back scattered electron diffraction, see EBSD
== C == * CAICISS – Coaxial impact collision ion scattering spectroscopy * CARS – Coherent anti-Stokes Raman spectroscopy * CBED – Convergent beam electron diffraction * CCM – Charge collection microscopy * CDI – Coherent diffraction imaging * CE – Capillary electrophoresis * CET – Cryo-electron tomography * CL – Cathodoluminescence * CLSM – Confocal laser scanning microscopy * COSY – Correlation spectroscopy * Cryo-EM – Cryo-electron microscopy * Cryo-SEM – Cryo-scanning electron microscopy * CV – Cyclic voltammetry
== D == * DE(T)A – Dielectric thermal analysis * dHvA – De Haas–van Alphen effect * DIC – Differential interference contrast microscopy * Dielectric spectroscopy * DLS – Dynamic light scattering * DLTS – Deep-level transient spectroscopy * DMA – Dynamic mechanical analysis * DPI – Dual polarisation interferometry * DRS – Diffuse reflection spectroscopy * DSC – Differential scanning calorimetry * DTA – Differential thermal analysis * DVS – Dynamic vapour sorption
== E == * EBIC – Electron beam induced current (see IBIC: ion beam induced charge) * EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS) * EBSD – Electron backscatter diffraction * ECOSY – Exclusive correlation spectroscopy * ECT – Electrical capacitance tomography * EDAX – Energy-dispersive analysis of x-rays * EDMR – Electrically detected magnetic resonance, see ESR or EPR * EDS or EDX – Energy dispersive X-ray spectroscopy * EELS – Electron energy loss spectroscopy * EFTEM – Energy filtered transmission electron microscopy * EID – Electron induced desorption * EIT and ERT – Electrical impedance tomography and electrical resistivity tomography * EL – Electroluminescence * Electron crystallography * ELS – Electrophoretic light scattering * ENDOR – Electron nuclear double resonance, see ESR or EPR * EPMA – Electron probe microanalysis * EPR – Electron paramagnetic resonance spectroscopy * ERD or ERDA – Elastic recoil detection or elastic recoil detection analysis * ESCA – Electron spectroscopy for chemical analysis see XPS * ESD – Electron stimulated desorption * ESEM – Environmental scanning electron microscopy * ESI-MS or ES-MS – Electrospray ionization mass spectrometry or electrospray mass spectrometry * ESR – Electron spin resonance spectroscopy * ESTM – Electrochemical scanning tunneling microscopy * EXAFS – Extended X-ray absorption fine structure * EXSY – Exchange spectroscopy
== F == * FCS – Fluorescence correlation spectroscopy * FCCS – Fluorescence cross-correlation spectroscopy * FEM – Field emission microscopy * FIB – Focused ion beam microscopy * FIM-AP – Field ion microscopy–atom probe * Flow birefringence * Fluorescence anisotropy * FLIM – Fluorescence lifetime imaging * Fluorescence microscopy * FOSPM – Feature-oriented scanning probe microscopy * FRET – Fluorescence resonance energy transfer * FRS – Forward Recoil Spectrometry, a synonym of ERD * FTICR or FT-MS – Fourier-transform ion cyclotron resonance or Fourier-transform mass spectrometry * FTIR – Fourier-transform infrared spectroscopy
== G == * GC-MS – Gas chromatography-mass spectrometry * GDMS – Glow discharge mass spectrometry * GDOS – Glow discharge optical spectroscopy * GISAXS – Grazing incidence small angle X-ray scattering * GIXD – Grazing incidence X-ray diffraction * GIXR – Grazing incidence X-ray reflectivity * GLC – Gas-liquid chromatography * GPC – Gel permeation chromatography
== H == * HAADF – High angle annular dark-field imaging * HAS – Helium atom scattering * HPLC – High performance liquid chromatography * HREELS – High resolution electron energy loss spectroscopy * HREM – High-resolution electron microscopy * HRTEM – High-resolution transmission electron microscopy * HI-ERDA – Heavy-ion elastic recoil detection analysis * HE-PIXE – High-energy proton induced X-ray emission
== I == * IAES – Ion induced Auger electron spectroscopy * IBA – Ion beam analysis * IBIC – Ion beam induced charge microscopy * ICP-AES – Inductively coupled plasma atomic emission spectroscopy * ICP-MS – Inductively coupled plasma mass spectrometry * Immunofluorescence * ICR – Ion cyclotron resonance * IETS – Inelastic electron tunneling spectroscopy * IGA – Intelligent gravimetric analysis * IGF – Inert gas fusion * IIX – Ion induced X-ray analysis, see particle induced X-ray emission * INS – Ion neutralization spectroscopy * Inelastic neutron scattering * IRNDT – Infrared non-destructive testing of materials * IRS – Infrared spectroscopy * ISS – Ion scattering spectroscopy * ITC – Isothermal titration calorimetry * IVEM – Intermediate voltage electron microscopy
== L == * LALLS – Low-angle laser light scattering * LC-MS – Liquid chromatography-mass spectrometry * LEED – Low-energy electron diffraction * LEEM – Low-energy electron microscopy * LEIS – Low-energy ion scattering * LIBS – Laser induced breakdown spectroscopy * LOES – Laser optical emission spectroscopy * LS – Light (Raman) scattering
== M == * MALDI – Matrix-assisted laser desorption/ionization * MBE – Molecular beam epitaxy * MEIS – Medium energy ion scattering * MFM – Magnetic force microscopy * MIT – Magnetic induction tomography * MPM – Multiphoton fluorescence microscopy * MRFM – Magnetic resonance force microscopy * MRI – Magnetic resonance imaging * MS – Mass spectrometry * MS/MS – Tandem mass spectrometry * MSGE – Mechanically stimulated gas emission * Mössbauer spectroscopy * MTA – Microthermal analysis
== N == * NAA – Neutron activation analysis * ND – Neutron diffraction * NDP – Neutron depth profiling * NEXAFS – Near edge X-ray absorption fine structure * NIS – Nuclear inelastic scattering/absorption * NMR – Nuclear magnetic resonance spectroscopy * NOESY – Nuclear Overhauser effect spectroscopy * NRA – Nuclear reaction analysis * NSOM – Near-field optical microscopy
== O == * OBIC – Optical beam induced current * ODNMR – Optically detected magnetic resonance, see ESR or EPR * OES – Optical emission spectroscopy * Osmometry
== P == * PAS – Positron annihilation spectroscopy * Photoacoustic spectroscopy * PAT or PACT – Photoacoustic tomography or photoacoustic computed tomography * PAX – Photoemission of adsorbed xenon * PC or PCS – Photocurrent spectroscopy * Phase contrast microscopy * PhD – Photoelectron diffraction * PD – Photodesorption * PDEIS – Potentiodynamic electrochemical impedance spectroscopy * PDS – Photothermal deflection spectroscopy * PED – Photoelectron diffraction * PEELS – parallel electron energy loss spectroscopy * PEEM – Photoemission electron microscopy (or photoelectron emission microscopy) * PES – Photoelectron spectroscopy * PINEM – photon-induced near-field electron microscopy * PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis * PIXE – Particle (or proton) induced X-ray spectroscopy * PL – Photoluminescence * Porosimetry * Powder diffraction * PTMS – Photothermal microspectroscopy * PTS – Photothermal spectroscopy
== Q == * QENS – Quasielastic neutron scattering * QCM-D – Quartz crystal microbalance with dissipation monitoring
== R == * Raman spectroscopy * RAXRS – Resonant anomalous X-ray scattering * RBS – Rutherford backscattering spectrometry * REM – Reflection electron microscopy * RDS – Reflectance difference spectroscopy * RHEED – Reflection high energy electron diffraction * RIMS – Resonance ionization mass spectrometry * RIXS – Resonant inelastic X-ray scattering * RR spectroscopy – Resonance Raman spectroscopy
== S == * SAD – Selected area diffraction * SAED – Selected area electron diffraction * SAM – Scanning Auger microscopy * SANS – Small angle neutron scattering * SAXS – Small angle X-ray scattering * SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation * SCEM – Scanning confocal electron microscopy * SE – Spectroscopic ellipsometry * SEC – Size exclusion chromatography * SEIRA – Surface enhanced infrared absorption spectroscopy * SEM – Scanning electron microscopy * SERS – Surface enhanced Raman spectroscopy * SERRS – Surface enhanced resonance Raman spectroscopy * SESANS – Spin Echo Small Angle Neutron Scattering * SEXAFS – Surface extended X-ray absorption fine structure * SICM – Scanning ion-conductance microscopy * SIL – Solid immersion lens * SIM – Solid immersion mirror * SIMS – Secondary ion mass spectrometry * SNMS – Sputtered neutral species mass spectrometry * SNOM – Scanning near-field optical microscopy * SPECT – Single-photon emission computed tomography * SPM – Scanning probe microscopy * SRM-CE/MS – Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry * SSNMR – Solid-state nuclear magnetic resonance * Stark spectroscopy * STED – Stimulated emission depletion microscopy * STEM – Scanning transmission electron microscopy * STM – Scanning tunneling microscopy * STS – Scanning tunneling spectroscopy * SXRD – Surface X-ray diffraction
== T == * TAT or TACT – Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography – PAT) * TEM – Transmission electron microscopy * TGA – Thermogravimetric analysis * TIKA – Transmitting ion kinetic analysis * TIMS – Thermal ionization mass spectrometry * TIRFM – Total internal reflection fluorescence microscopy * TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy * TMA – Thermomechanical analysis * TOF-MS – Time-of-flight mass spectrometry * Two-photon excitation microscopy * TXRF – Total reflection X-ray fluorescence analysis
== U == * Ultrasound attenuation spectroscopy * UPS – UV-photoelectron spectroscopy * USANS – Ultra small-angle neutron scattering * USAXS – Ultra small-angle X-ray scattering * UT – Ultrasonic testing * UV-Vis – Ultraviolet–visible spectroscopy
== V == * VEDIC – Video-enhanced differential interference contrast microscopy * Voltammetry
== W == * WAXS – Wide angle X-ray scattering * WDX or WDS – Wavelength dispersive X-ray spectroscopy
== X == * XAES – X-ray induced Auger electron spectroscopy * XANES – XANES, synonymous with NEXAFS (near edge X-ray absorption fine structure) * XAS – X-ray absorption spectroscopy * X-CTR – X-ray crystal truncation rod scattering * X-ray crystallography * XDS – X-ray diffuse scattering * XES – X-ray emission spectroscopy * XPEEM – X-ray photoelectron emission microscopy * XPS – X-ray photoelectron spectroscopy * XRD – X-ray diffraction * XRES – X-ray resonant exchange scattering * XRF – X-ray fluorescence analysis * XRR – X-ray reflectivity * XRS – X-ray Raman scattering * XRT – X-ray transmission * XSW – X-ray standing wave technique
== See also == * Characterization (materials science)
== References == * {{cite book | author=Callister, WD | title=Materials Science and Engineering – An Introduction | publisher=John Wiley and Sons | location=London | year=2000 | isbn=0-471-32013-7}} * {{cite book | editor=Yao, N | title=Focused Ion Beam Systems: Basics and Applications | publisher=Cambridge University Press | location=Cambridge, UK | year=2007 | isbn=978-0-521-83199-4}}
Materials analysis methods Category:Analytical chemistry Materials analysis methods Materials analysis methods