# Standard Test Data Format

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File format

**Standard Test Data Format** (**STDF**) is a proprietary [file format](/source/File_format) for [semiconductor](/source/Semiconductor) test information originally developed by [Teradyne](/source/Teradyne), but it is now a [de facto standard](/source/De_facto_standard) widely used throughout the semiconductor industry. It is a commonly used format produced by [automatic test equipment](/source/Automatic_test_equipment) (ATE) platforms from companies such as SPEA S.p.A, [Cohu](https://en.wikipedia.org/w/index.php?title=Cohu&action=edit&redlink=1), [Roos Instruments](/source/Roos_Instruments), [Teradyne](/source/Teradyne), [Advantest](/source/Advantest), and others.

STDF is a [binary](/source/Binary_file) format, but can be converted either to an [ASCII](/source/ASCII) format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing [statistical analysis](/source/Statistical_analysis) on a population of [tested devices](/source/Device_under_test).

[Reference: STDF Specifications V4](http://www.kanwoda.com/wp-content/uploads/2015/05/std-spec.pdf)

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