# Process control monitoring

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In the application of [integrated circuits](/source/integrated_circuits), '''process control monitoring''' ('''PCM''')<ref>{{Cite web|date=2019-05-14|title=A Guide To Statistical Process Control|url=https://redmeters.com/a-guide-to-statistical-process-control/|access-date=2021-03-29|website=Red Meters|language=en-US}}</ref> is the procedure followed to obtain detailed information about the process used.

PCM is associated with designing and fabricating special structures that can monitor technology specific parameters such as V<sub>th</sub> in [CMOS](/source/CMOS) and V<sub>be</sub> in bipolars. These structures are placed across the wafer at specific locations along with the chip produced so that a closer look into the process variation is possible.

==References==
{{Reflist}}

Category:Integrated circuits

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