# Parasitic extraction

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In [electronic design automation](/source/electronic_design_automation), '''parasitic extraction''' is the calculation of the parasitic effects in both the designed devices and the required wiring [interconnect](/source/interconnects_(integrated_circuits))s of an [electronic circuit](/source/electronic_circuit): [parasitic capacitance](/source/parasitic_capacitance)s, [parasitic resistance](/source/parasitic_resistance)s and [parasitic inductance](/source/parasitic_inductance)s, commonly called [parasitic device](/source/parasitic_device)s, parasitic components, or simply parasitics.

The major purpose of parasitic extraction is to create an accurate analog model of the circuit, so that detailed simulations can emulate actual digital and analog circuit responses. Digital circuit responses are often used to populate databases for signal delay and loading calculation such as: [timing analysis](/source/Static_timing_analysis); [power analysis](/source/Power_optimization_(EDA)); [circuit simulation](/source/circuit_simulation); and [signal integrity](/source/signal_integrity) analysis. Analog circuits are often run in detailed test benches to indicate if the extra extracted parasitics will still allow the designed circuit to function.

== Background ==

In early [integrated circuit](/source/integrated_circuit)s the impact of the wiring was negligible, and wires were not considered as electrical elements of the circuit. However below the 0.5-[micrometre](/source/micrometre) [technology node](/source/technology_node) resistance and capacitance of the interconnects started making a significant impact on circuit performance.<ref>"Automatic Layout Modification", by Michael Reinhardt, [https://books.google.com/books?id=N4c5BKo-SnsC&pg=PA120&dq=%22parasitic+extraction%22 p. 120]</ref><!-- not the best choice; a better ref to be added --> With shrinking [process](/source/semiconductor_device_fabrication) technologies inductance effects of interconnects became important as well.

Major effects of interconnect parasitics include: [signal delay](/source/Group_delay_and_phase_delay), [signal noise](/source/signal_noise), [IR drop (resistive component of voltage)](/source/Power_network_design_(IC)).

==Interconnect capacitance extraction==
Interconnect capacitance is calculated by giving the extraction tool the following information: the top view layout of the design in the form of input polygons on a set of layers; a mapping to a set of devices and pins (from a [Layout Versus Schematic](/source/Layout_Versus_Schematic) run), and a cross sectional understanding of these layers. This information is used to create a set of layout wires that have added capacitors where the input polygons and cross sectional structure  indicate. The output netlist contains the same set of input nets as the input design netlist and adds parasitic capacitor devices between these nets.

==Interconnect resistance extraction==

Interconnect resistance is calculated by giving the extraction tool the following information: the top view layout of the design in the form of input polygons on a set of layers; a mapping to a set of devices and pins (from a [Layout Versus Schematic](/source/Layout_Versus_Schematic) run), and a cross sectional understanding of these layers including the resistivity of the layers. This information is used to create a set of layout sub.wires that have added resistance between various sub-parts of the wires. The above Interconnect Capacitance is divided and shared amongst the sub-nodes in a proportional way. Note that unlike Interconnect Capacitance, Interconnect Resistance needs to add sub-nodes between the circuit elements to place these parasitic resistors. This can greatly increase the size of the extracted output netlist and can cause additional simulation problems.

==Interconnect inductance extraction==

{{Empty section|date=July 2010}}

==Tools and vendors==
The tools fall into the following broad categories.
*[Field solver](/source/Field_solver)s provide physically accurate solutions. They calculate electromagnetic parameters by directly solving [Maxwell's equations](/source/Maxwell's_equations). Due to high calculation burden they are applicable only very small designs or to parts of the designs.
*Approximate solutions with pattern matching techniques are the only feasible approach to extract parasitics for complete modern integrated circuit designs.

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===ANSYS Q3D Extractor===
[ANSYS](/source/ANSYS) Q3D Extractor uses method of moments (integral equations) and FEMs to compute capacitive, conductance, inductance and resistance matrices. It uses the [fast multipole method](/source/fast_multipole_method) (FMM) to accelerate the solution of the integral equations. Outputs from the solver include current and voltage distributions, CG and RL matrices.<ref>[http://www.rle.mit.edu/cpg/ MIT Computational Prototyping Group]</ref><ref>[http://www.ansys.com/Products/Simulation+Technology/Electromagnetics/Signal+Integrity/ANSYS+Q3D+Extractor ANSYS Q3D Extractor]</ref>

=== FastCap, FastHenry ===
FastCap and FastHenry, from [MIT](/source/MIT), are two free parasitics extractor tools for capacitance, inductance, and resistance. Quoted in many scientific articles, they are considered golden references in their field.{{cn|date=June 2021}}

Source code and Windows binary versions with viewer and editor are freely available from [http://www.fastfieldsolvers.com FastFieldSolvers].<ref>[http://www.rle.mit.edu/cpg/ MIT Computational Prototyping Group]</ref><ref>[http://www.fastfieldsolvers.com FastFieldSolvers]</ref>

=== StarRC ===
StarRC from [Synopsys](/source/Synopsys) (previously from [Avanti](/source/Avanti_Corporation)) is a universal parasitics extractor tool applicable for a full range of electronic designs.<ref>[http://www.synopsys.com/Tools/Implementation/SignOff/Pages/StarRC-ds.aspx StarRC]</ref>

=== Quantus ===
Quantus from [Cadence](/source/Cadence_Design_Systems) is a parasitic extractor tool for both digital and analog designs and parasitics extraction check have to be carried out to prepare the design for postlayout verification.<ref>[https://www.cadence.com/content/cadence-www/global/en_US/home/tools/digital-design-and-signoff/silicon-signoff/quantus-qrc-extraction-solution.html Quantus QRC Extraction Solution]</ref>

=== QuickCap ===
QuickCap NX from [Synopsys](/source/Synopsys) is a parasitic extractor tool for both digital and analog designs.<ref>[http://www.synopsys.com/Tools/Implementation/SignOff/Pages/quickcap-nx-ds.aspx QuickCap]</ref>  It was based on QuickCap developed by Ralph Iverson of Random Logic Corporation, which was acquired by Magma and Synopsys.

=== Calibre xACT3D ===
Calibre xACT3D from [Mentor Graphics](/source/Mentor_Graphics) is a parasitic extractor tool for both digital and analog designs.<ref>[http://www.mentor.com/products/ic_nanometer_design/verification-signoff/circuit-verification/calibre-xact/upload/calibre_xact-datasheet.pdf Calibre xACT3D]</ref>  It was based on PexRC developed by Wangqi Qiu and Weiping Shi of Pextra Corporation, which was acquired by Mentor.

== See also ==
* [Standard Parasitic Exchange Format](/source/Standard_Parasitic_Exchange_Format)

== References ==
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Category:Electronic circuit verification

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Adapted from the Wikipedia article [Parasitic extraction](https://en.wikipedia.org/wiki/Parasitic_extraction) by Wikipedia contributors ([contributor history](https://en.wikipedia.org/wiki/Parasitic_extraction?action=history)). Available under [Creative Commons Attribution-ShareAlike 4.0 International](https://creativecommons.org/licenses/by-sa/4.0/). Changes may have been made.
